Added references to papers that describe some concepts for the first time
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51
README.md
51
README.md
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de.uni-kl.ems.dram.vp.system
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============================
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Generic DRAM controller simulator and related tools.
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Generic DRAM controller simulator **DRAMSys** [1] and related tools.
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## Basic Setup
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@@ -26,7 +26,7 @@ $ git clone --recursive https://<user>@git.rhrk.uni-kl.de/EIT-Wehn/dram.vp.syste
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```
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The *--recursive* flag tells git to initialize all submodules within the
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repository. **DRAMPower** and **tinyxml** are examples third party
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repository. **DRAMPower** [2] and **tinyxml** are examples third party
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repositories that were embedded within the source tree as submodules.
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It is possible to work with a copy of the official codebase. The copy is
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@@ -211,7 +211,7 @@ Below are listed the configuration sections and configuration fields.
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```
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- *BankwiseLogic* (boolean)
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- "1": perform bankwise operations such as bankwise-refresh and bankwise-powerdown
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- "1": perform bankwise-refresh [3] and bankwise-powerdown [4]
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- "0": do not perform bankwise operations
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- *OpenPagePolicy* (boolean)
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- "1": use open page precharge policy
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@@ -219,14 +219,14 @@ Below are listed the configuration sections and configuration fields.
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- *MaxNrOfTransactions* (unsigned int)
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- Maximum number of transactions.
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- *Scheduler* (string)
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- Scheduler algorithm to be applied on memory transactions. Different
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schedulers can order transactions based on different factors such as
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latency, power savings, etc.
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- "FIFO": first in, first out
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- "FIFO_STRICT": out-of-order treatment of queue elements not allowed
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- "FR_FCFS": first-come, first-served
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- *Capsize* (unsigned int)
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- Capacitor cell size.
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- *PowerDownMode* (enum EPowerDownMode)
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- "NoPowerDown": no power down mode (active idle)
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- "Staggered": staggered power down policy
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- "Staggered": staggered power down policy [5]
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- "TimeoutPDN": precharge idle
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- "TimeoutSREF": self refresh
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- *Buswidth* (unsigned int)
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@@ -244,22 +244,21 @@ Below are listed the configuration sections and configuration fields.
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- *ErrorStoreMode* (enum ErrorStorageMode)
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- "NoStorage": no storage
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- "Store": store data without error model
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- "ErrorModel": store data with error model
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[1]: http://google.com
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[2]: http://google.com
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- "ErrorModel": store data with error model [6]
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- **Trace setups**
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- *id*
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- trace setup id
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- *clkMhz*
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- speed of the trace player
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Some attributes are self-explanatory while others require some previous
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knowhow of memory technologies or some knowledge of the simulator source code.
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Some resources of the simulator are available in the **resources** directory
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its sub-directories.
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Resources of the simulator are available in the **resources** directory its
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sub-directories.
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``` xml
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``` bash
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$ cd /projects/dram.vp.system/dram/resources
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```
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@@ -277,3 +276,27 @@ A description of the content each directory follows.
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- **traces**: trace files for simulations. They contain accesses to memory
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in certain known scenarios.
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#### References
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[1] TLM Modelling of 3D Stacked Wide I/O DRAM Subsystems, A Virtual Platform for Memory Controller Design Space Exploration
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M. Jung, C. Weis, N. Wehn, K. Chandrasekar. International Conference on High-Performance and Embedded Architectures and Compilers 2013 (HiPEAC), Workshop on: Rapid Simulation and Performance Evaluation: Methods and Tools (RAPIDO), January, 2013, Berlin.
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[2] DRAMPower: Open-source DRAM Power & Energy Estimation Tool
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Karthik Chandrasekar, Christian Weis, Yonghui Li, Sven Goossens, Matthias Jung, Omar Naji, Benny Akesson, Norbert Wehn, and Kees Goossens
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URL: http://www.drampower.info
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[3] Energy Optimization in 3D MPSoCs with Wide-I/O DRAM
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M. Sadri, M. Jung, C. Weis, N. Wehn, L. Benini. Conference Design, Automation and Test in Europe (DATE), March, 2014, Dresden, Germany.
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[4] DRAMSys: A flexible DRAM Subsystem Design Space Exploration Framework
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M. Jung, C. Weis, N. Wehn. Accepted for publication, IPSJ Transactions on System LSI Design Methodology (T-SLDM), October, 2015.
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[5] Optimized Active and Power-Down Mode Refresh Control in 3D-DRAMs
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M. Jung, M. Sadri, C. Weis, N. Wehn, L. Benini., VLSI-SoC, October, 2014, Playa del Carmen, Mexico.
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[6] Retention Time Measurements and Modelling of Bit Error Rates of WIDE-I/O DRAM in MPSoCs
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C. Weis, M. Jung, P. Ehses, C. Santos, P. Vivet, S. Goossens, M. Koedam, N. Wehn. Accepted for publication, IEEE Conference Design, Automation and Test in Europe (DATE), March, 2015, Grenoble, France
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[7] http://www.uni-kl.de/3d-dram/publications/
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