Added references to papers that describe some concepts for the first time

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Éder Ferreira Zulian
2015-05-26 16:42:50 +02:00
parent 2ae1f82b69
commit b3d05926dd

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@@ -1,7 +1,7 @@
de.uni-kl.ems.dram.vp.system
============================
Generic DRAM controller simulator and related tools.
Generic DRAM controller simulator **DRAMSys** [1] and related tools.
## Basic Setup
@@ -26,7 +26,7 @@ $ git clone --recursive https://<user>@git.rhrk.uni-kl.de/EIT-Wehn/dram.vp.syste
```
The *--recursive* flag tells git to initialize all submodules within the
repository. **DRAMPower** and **tinyxml** are examples third party
repository. **DRAMPower** [2] and **tinyxml** are examples third party
repositories that were embedded within the source tree as submodules.
It is possible to work with a copy of the official codebase. The copy is
@@ -211,7 +211,7 @@ Below are listed the configuration sections and configuration fields.
```
- *BankwiseLogic* (boolean)
- "1": perform bankwise operations such as bankwise-refresh and bankwise-powerdown
- "1": perform bankwise-refresh [3] and bankwise-powerdown [4]
- "0": do not perform bankwise operations
- *OpenPagePolicy* (boolean)
- "1": use open page precharge policy
@@ -219,14 +219,14 @@ Below are listed the configuration sections and configuration fields.
- *MaxNrOfTransactions* (unsigned int)
- Maximum number of transactions.
- *Scheduler* (string)
- Scheduler algorithm to be applied on memory transactions. Different
schedulers can order transactions based on different factors such as
latency, power savings, etc.
- "FIFO": first in, first out
- "FIFO_STRICT": out-of-order treatment of queue elements not allowed
- "FR_FCFS": first-come, first-served
- *Capsize* (unsigned int)
- Capacitor cell size.
- *PowerDownMode* (enum EPowerDownMode)
- "NoPowerDown": no power down mode (active idle)
- "Staggered": staggered power down policy
- "Staggered": staggered power down policy [5]
- "TimeoutPDN": precharge idle
- "TimeoutSREF": self refresh
- *Buswidth* (unsigned int)
@@ -244,22 +244,21 @@ Below are listed the configuration sections and configuration fields.
- *ErrorStoreMode* (enum ErrorStorageMode)
- "NoStorage": no storage
- "Store": store data without error model
- "ErrorModel": store data with error model
[1]: http://google.com
[2]: http://google.com
- "ErrorModel": store data with error model [6]
- **Trace setups**
- *id*
- trace setup id
- *clkMhz*
- speed of the trace player
Some attributes are self-explanatory while others require some previous
knowhow of memory technologies or some knowledge of the simulator source code.
Some resources of the simulator are available in the **resources** directory
its sub-directories.
Resources of the simulator are available in the **resources** directory its
sub-directories.
``` xml
``` bash
$ cd /projects/dram.vp.system/dram/resources
```
@@ -277,3 +276,27 @@ A description of the content each directory follows.
- **traces**: trace files for simulations. They contain accesses to memory
in certain known scenarios.
#### References
[1] TLM Modelling of 3D Stacked Wide I/O DRAM Subsystems, A Virtual Platform for Memory Controller Design Space Exploration
M. Jung, C. Weis, N. Wehn, K. Chandrasekar. International Conference on High-Performance and Embedded Architectures and Compilers 2013 (HiPEAC), Workshop on: Rapid Simulation and Performance Evaluation: Methods and Tools (RAPIDO), January, 2013, Berlin.
[2] DRAMPower: Open-source DRAM Power & Energy Estimation Tool
Karthik Chandrasekar, Christian Weis, Yonghui Li, Sven Goossens, Matthias Jung, Omar Naji, Benny Akesson, Norbert Wehn, and Kees Goossens
URL: http://www.drampower.info
[3] Energy Optimization in 3D MPSoCs with Wide-I/O DRAM
M. Sadri, M. Jung, C. Weis, N. Wehn, L. Benini. Conference Design, Automation and Test in Europe (DATE), March, 2014, Dresden, Germany.
[4] DRAMSys: A flexible DRAM Subsystem Design Space Exploration Framework
M. Jung, C. Weis, N. Wehn. Accepted for publication, IPSJ Transactions on System LSI Design Methodology (T-SLDM), October, 2015.
[5] Optimized Active and Power-Down Mode Refresh Control in 3D-DRAMs
M. Jung, M. Sadri, C. Weis, N. Wehn, L. Benini., VLSI-SoC, October, 2014, Playa del Carmen, Mexico.
[6] Retention Time Measurements and Modelling of Bit Error Rates of WIDE-I/O DRAM in MPSoCs
C. Weis, M. Jung, P. Ehses, C. Santos, P. Vivet, S. Goossens, M. Koedam, N. Wehn. Accepted for publication, IEEE Conference Design, Automation and Test in Europe (DATE), March, 2015, Grenoble, France
[7] http://www.uni-kl.de/3d-dram/publications/