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Lukas Steiner
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@@ -482,21 +482,20 @@ $ ./DRAMSys ../../DRAMSys/library/resources/simulations/wideio-thermal.json
## References
[1] TLM Modelling of 3D Stacked Wide I/O DRAM Subsystems, A Virtual Platform for Memory Controller Design Space Exploration
[1] TLM Modelling of 3D Stacked Wide I/O DRAM Subsystems, A Virtual Platform for Memory Controller Design Space Exploration
M. Jung, C. Weis, N. Wehn, K. Chandrasekar. International Conference on High-Performance and Embedded Architectures and Compilers 2013 (HiPEAC), Workshop on: Rapid Simulation and Performance Evaluation: Methods and Tools (RAPIDO), January, 2013, Berlin.
[2] DRAMSys: A flexible DRAM Subsystem Design Space Exploration Framework
[2] DRAMSys: A flexible DRAM Subsystem Design Space Exploration Framework
M. Jung, C. Weis, N. Wehn. IPSJ Transactions on System LSI Design Methodology (T-SLDM), October, 2015.
[3] DRAMSys4.0: A Fast and Cycle-Accurate SystemC/TLM-Based DRAM Simulator
[3] DRAMSys4.0: A Fast and Cycle-Accurate SystemC/TLM-Based DRAM Simulator
L. Steiner, M. Jung, F. S. Prado, K. Bykov, N. Wehn. International Conference on Embedded Computer Systems: Architectures, Modeling, and Simulation (SAMOS), July, 2020, Samos Island, Greece.
[4] DRAMPower: Open-source DRAM Power & Energy Estimation Tool
K. Chandrasekar, C. Weis, Y. Li, S. Goossens, M. Jung, O. Naji, B. Akesson, N. Wehn, K. Goossens
URL: http://www.drampower.info
[4] DRAMPower: Open-source DRAM Power & Energy Estimation Tool
K. Chandrasekar, C. Weis, Y. Li, S. Goossens, M. Jung, O. Naji, B. Akesson, N. Wehn, K. Goossens. URL: http://www.drampower.info
[5] Optimized Active and Power-Down Mode Refresh Control in 3D-DRAMs
[5] Optimized Active and Power-Down Mode Refresh Control in 3D-DRAMs
M. Jung, M. Sadri, C. Weis, N. Wehn, L. Benini. VLSI-SoC, October, 2014, Playa del Carmen, Mexico.
[6] Retention Time Measurements and Modelling of Bit Error Rates of WIDE-I/O DRAM in MPSoCs
C. Weis, M. Jung, P. Ehses, C. Santos, P. Vivet, S. Goossens, M. Koedam, N. Wehn. IEEE Conference Design, Automation and Test in Europe (DATE), March, 2015, Grenoble, France
[6] Retention Time Measurements and Modelling of Bit Error Rates of WIDE-I/O DRAM in MPSoCs
C. Weis, M. Jung, P. Ehses, C. Santos, P. Vivet, S. Goossens, M. Koedam, N. Wehn. IEEE Conference Design, Automation and Test in Europe (DATE), March, 2015, Grenoble, France.